SOLID STATE IONICS固态离子学
SOLID STATE IONICS(英文缩写 SOLID STATE IONICS),ISSN 0167-2738,eISSN 1872-7689,中文译名:固态离子学 是一本学术期刊。本页汇总该期刊的最新影响因子、分区信息以及最新收录于 PubMed 的文献,帮助您快速了解期刊全貌。
发文量统计区间：2025-11-01 至 2026-10-31，按本站收录文献的发表日期统计。
期刊介绍
历年影响因子趋势
| JCR 数据年份 | 影响因子 | JCR 分区 |
|---|---|---|
| 2021 | 3.699 | Q2 |
| 2022 | 3.200 | Q2 |
| 2023 | 3.000 | Q2 |
| 2024 | 3.300 | Q2 |
| 2025 | 3.700 | Q2 |
SOLID STATE IONICS 最新收录文献
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1. Investigation of patterned and non-patterned poly(2,6-dimethyl 1,4-phenylene) oxide based anion exchange membranes for enhanced desalination and power generation in a microbial desalination cell.
1. 图案化和非图案化聚(2,6-二甲基-1,4-苯撑)氧化物基阴离子交换膜在微生物脱盐电池中增强脱盐和发电性能的研究PMID:日期:2018-01Quaternary ammonium poly(2,6-dimethyl 1,4-phenylene oxide) (QAPPO) anion exchange membranes (AEMs) with topographically patterned surfaces were assessed in a microbial desalination cell (MDC) system. The MDC results with these QAPPO AEMs were benchmarked against a commercially available AEM. The MDC with the non-patterned QAPPO AEM (Q1) displayed the best desalination rate (a reduction of salinity by 53 ± 2.7%) and power generation (189 ± 5 mW m) when compared against the commercially available AEM and the patterned AEMs. The enhanced performance with the Q1 AEM was attributed to its higher ionic conductivity and smaller thickness leading to a reduced area specific resistance. It is important to note that Real Pacific Ocean seawater and activated sludge were used into the desalination chamber and anode chamber respectively for the MDC - which mimicked realistic conditions. Although the non-patterned QAPPO AEM displayed better performance over the patterned QAPPO AEMs, it was observed that the anodic overpotential was smaller when the MDCs featured QAPPO AEMs with larger lateral feature sizes. The results from this study have important implications for the continuous improvements necessary for developing cheaper and better performing membranes in order to optimize the MDC.
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2. {"_":"Mapping electrochemically driven gas exchange of mixed conducting SrTiFeO and CeGdO thin films by O tracer incorporation under reducing atmosphere.","sub":["0.7","0.3","3 - δ","0.8","0.2","1.9"],"sup":["18"]}
PMID:日期:2015-05Thermally and electrochemically driven O tracer exchange experiments in H/HO atmosphere were performed on SrTiFeO and CeGdO thin films on single crystalline YSZ substrates. Noble metal current collectors were deposited on both films and electrochemically polarized during the exchange experiment. The resulting tracer distribution was analyzed by spatially resolved secondary ion mass spectrometry. Increased tracer fraction near the current collectors was found under cathodic polarization and decreased tracer fraction under anodic polarization. High cathodic bias leads to enhanced n-type electronic conductivity, which increases the extent of the electrochemically active zone.
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3. Oxygen reduction via grain boundary transport in thin film platinum electrodes on yttria stabilized zirconia.
PMID:日期:2015-05Model-type sputter deposited platinum microelectrodes with different grain sizes were investigated on single crystalline yttria stabilized zirconia (YSZ) by means of impedance spectroscopy. Measurements on single platinum microelectrodes could be continuously performed for > 100 h and from 250 to 800 °C without losing contact. From the temperature dependence, two parallel reaction pathways for oxygen reduction could be identified. Above 450 °C, a surface path with a rate determining step located at the three phase boundary is predominant. Its polarization resistance is independent of the Pt grain size and exhibits an activation energy of ca. 1.8 eV. In the low temperature regime (< 450 °C) a bulk path through Pt was verified, with an electrode polarization resistance depending on the Pt grain size. This resistance is only slightly thermally activated and the rate limiting step is most probably oxygen diffusion along Pt grain boundaries.
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4. {"_":"Electrochemical properties of LaSrCoO thin films investigated by complementary impedance spectroscopy and isotope exchange depth profiling.","sub":["0.6","0.4","3 - δ"]}
4. {"_":"通过互补阻抗谱和同位素交换深度剖析研究LaSrCoO薄膜的电化学性质。","sub":["PMID:日期:2014-03-01The oxygen exchange and diffusion properties of LaSrCoO thin films on yttria stabilized zirconia were analyzed by impedance spectroscopy and O tracer experiments. The investigations were performed on the same thin film samples and at the same temperature (400 °C) in order to get complementary information by the two methods. Electrochemical impedance spectroscopy can reveal resistive and capacitive contributions of such systems, but an exact interpretation of the spectra of complex oxide electrodes is often difficult from impedance data alone. It is shown that additional isotope exchange depth profiling can significantly help interpreting impedance spectra by giving reliable information on the individual contribution and exact location of resistances (surface, electrode bulk, interface). The measurements also allowed quantitative comparison of electrode polarization resistances obtained by different methods.
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5. The grain and grain boundary impedance of sol-gel prepared thin layers of yttria stabilized zirconia (YSZ).
5. 溶胶-凝胶法制备的氧化钇稳定氧化锆（YSZ）薄层的晶粒和晶界阻抗PMID:日期:2012-10-04Separating grain and grain boundary impedance contributions of ion conducting thin films is a highly non-trivial task. Recently, it could be shown that long, thin, closely spaced, and interdigitally arranged electrodes enabled such a separation on pulsed laser deposited yttria stabilized zirconia (YSZ) thin films. In this contribution, the same approach was used to investigate YSZ layers prepared by the sol-gel route on sapphire substrates. Grain and grain boundary properties were quantified for layers between 28 and 168 nm thickness. Only for the thinnest of the investigated layers, a deviation from macroscopic bulk properties was found, which could be correlated to interfacial strain in the epitaxial layer. A dependence of the preferential orientation on the film thickness was found.
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6. Measurement of the across-plane conductivity of YSZ thin films on silicon.
PMID:日期:2012-03-15Across-plane conductivity measurements on ion conducting thin films of a few ten nanometers thickness are challenging due to frequently occurring short-circuits through pinholes in the layer. In this contribution, a method is proposed which allowed across-plane conductivity measurements on yttria stabilized zirconia (YSZ) layers with thicknesses as low as 20 nm. YSZ layers were prepared onto silicon substrates with a thin native silica interlayer and the across-plane conductivity was measured on circular microelectrodes by impedance spectroscopy. The silica interlayer exhibits strongly blocking behavior, which helps to avoid short-circuits through pinholes. Different relaxation frequencies of YSZ and silica make separation of these layers possible. An equivalent circuit is suggested, which allows extraction of YSZ properties, and its validity is proven by varying microelectrodes size and layer thickness. All parameters yield the expected behavior.
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7. The separation of grain and grain boundary impedance in thin yttria stabilized zirconia (YSZ) layers.
7. 薄层氧化钇稳定氧化锆（YSZ）中晶粒与晶界阻抗的分离PMID:日期:2011-03-11An improved electrode geometry is proposed to study thin ion conducting films by impedance spectroscopy. It is shown that long, thin, and closely spaced electrodes arranged interdigitally allow a separation of grain and grain boundary effects also in very thin films. This separation is shown to be successful for yttria stabilized zirconia (YSZ) layers thinner than 20 nm. In a series of experiments it is demonstrated that the extracted parameters correspond to the YSZ grain boundary and grain bulk resistances or to grain boundary and substrate capacitances. Results also show that our YSZ films produced by pulsed-laser deposition (PLD) on sapphire substrates exhibit a bulk conductivity which is very close to that of macroscopic YSZ samples.
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8. {"_":"Measurement of O tracer diffusion coefficients in thin yttria stabilized zirconia films.","sup":["18"]}
PMID:日期:2011-03-03In this paper we present a method to measure oxygen tracer diffusion coefficients in thin ion conducting films without being limited by slow oxygen incorporation kinetics. The method is based on a two step process. In the first step a substantial amount of O tracer is locally incorporated for example into an yttria stabilized zirconia (YSZ) layer at low temperatures with the aid of an electric current, thus overcoming slow thermal oxygen exchange while still limiting lateral diffusion to a minimum. In the second step controlled diffusion takes place at elevated temperatures in ultra high vacuum (UHV) to impede loss of tracer due to oxygen exchange at the film surface. In this second step the surface of the thin film may additionally be modified compared to the oxygen incorporation step. This allows to easily investigate effects of interfaces on ion transport. The achieved in-plane concentration profiles are then measured by secondary ion mass spectrometry (SIMS). Comparison with electrical measurements on YSZ thin films proves the applicability of the method.