IEEE TRANSACTIONS ON RELIABILITY
IEEE TRANSACTIONS ON RELIABILITY(英文缩写 IEEE T RELIAB),ISSN 0018-9529,eISSN 1558-1721 是一本学术期刊。本页汇总该期刊的最新影响因子、分区信息以及最新收录于 PubMed 的文献,帮助您快速了解期刊全貌。
发文量统计区间:2025-09-21 至 2026-09-21,按本站收录文献的发表日期统计。
指标来源:jcr_cas_ifqb
期刊简介
暂无简介。
历年影响因子趋势
| JCR 数据年份 | 影响因子 | JCR 分区 |
|---|---|---|
| 2021 | 5.883 | Q1 |
| 2022 | 5.900 | Q1 |
| 2023 | 5.000 | Q1 |
| 2024 | 5.700 | Q1 |
| 2025 | 5.400 | Q1 |
IEEE TRANSACTIONS ON RELIABILITY 最新收录文献
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2. A Study on Effects of Copper Wrap Specifications on Printed Circuit Board Reliability.
PMID:作者:日期:2019-03-01During the manufacturing of printed circuit boards (PCBs) for a Flight Project, it was found that a European manufacturer was building its boards to a European standard that had no requirement for copper wrap on the vias. The amount of copper wrap that was measured on coupons from the panel containi…
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3. Finding Bugs in Cryptographic Hash Function Implementations.
PMID:作者:日期:2018-01-01Cryptographic hash functions are security-critical algorithms with many practical applications, notably in digital signatures. Developing an approach to test them can be particularly difficult, and bugs can remain unnoticed for many years. We revisit the NIST hash function competition, which was use…